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Wiesendanger RolandMeyer E.

Noncontact Atomic Force Microscopy

AutorWiesendanger RolandMeyer E.
QuelleSonstige Datenquellen
ISBN978-3-642-62772-9
Lieferbarkeitlieferbar
KatalogisatBasiskatalogisat
VerlagSpringer Berlin
Erscheinungsdatum23.10.2012
Buch | Kartoniert
213,99 €
inkl. 7% MwSt.

Beschreibung (Langtext)

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

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